Selective Multiple Capture Test (SMART) XLBIST

2021年10月12日 — One of the major factors impacting test time and test coverage with logic BIST is the paths in the design generating unknown (ie X) simulation values.

- Amit Sanghani of Nvidia Synopsys' DW memory BIST is too limited to be useful. Why black box the logic? Are they proud of their IP or ashamed of it? It ...

由 P Wohl 著作 · 2022 · 被引用 1 次 — Logic BIST (LBIST) relies on on-chip pattern generation and response analysis to reduce the entire test set to a few seeds. These seeds can be either stored ...

Enables structural testing of logic during in-system operation. Synopsys SLM BIST IP delivers a solution for in-system self-test of digital designs where ...

2023年12月19日 — Synopsys SLM BIST IP delivers a solution for in-system self-test of digital designs where functional safety is critical, such as automotive, ...

It is an extension of Synopsys' unique 1-pass test synthesis flow, which enables designers to use SoCBIST directly within the physical synthesis environment.

2002年9月30日 — Compared to full scan, SoCBIST cuts tester time by more than tenfold and reduces test-data volume 100 to 400 times while deterministically ...

2019年3月8日 — Synopsys TestMAX XLBIST delivers a solution for in-system self-test of digital designs where functional safety is critical, ...

Synopsys TestMAX XLBIST delivers a solution for in-system self-test of digital designs where functional safety is critical.

2021年10月12日 — Logic BIST 是系統內測試的關鍵DFT 元件，用於測試設計中記憶體以外的其他邏輯部分。 ... MISR 簽章會與晶片上或晶片外的預存的簽章符號進行比較，以確定測試 ...